Scanning electron microscopy

We offer sample characterization using a high-resolution scanning electron microscope (HRSEM) Auriga 60 from Carl Zeiss with resolution capability better than 2.0 nm 1 kV, better than 1.0 nm 15 kV, magnification: from 20 to 2,000,000:

  • accelerating voltage: from 0.1 kV to 30 kV
  • diameter of test samples up to 200 mm
  • possibility of characterization with angular tilt up to 65 degrees
  • ability to characterize sample cross sections

Keywords: sem, topography imaging, morphology of materials, nanomaterials, defect


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