Scanning electron microscopy

We offer sample characterization using a high-resolution scanning electron microscope (HRSEM) Auriga 60 from Carl Zeiss with resolution capability better than 2.0 nm 1 kV, better than 1.0 nm 15 kV, magnification: from 20 to 2,000,000:

accelerating voltage: from 0.1 kV to 30 kV
diameter of test samples up to 200 mm
possibility of characterization with angular tilt up to 65 degrees
ability to characterize sample cross sections

Keywords: sem, topography imaging, morphology of materials, nanomaterials, defect

contact: uslugi.cezamat@pw.edu.pl