Ellipsometric measurements

We perform complete ellipsometric measurements of samples.

We offer:

measuring substrates with a maximum diameter of 200 mm
determination of the thickness of thin layers of transmission or partially transmission materials
estimation of the composition of multicomponent materials
thickness measurements of multilayer materials and determination of optical parameters of these layers
mapping (2D) of the determined parameters (thickness and optical parameters) on the sample surface
spectral range of measurement from 190 nm to 2100 nm
range of angle movement of arms from 40° to 90°
wide base of materials that allows matching the model to the measurement conditions and the measured materials

Keywords: ellipsometer, ellipsometric measurements, ellipsometric analysis, composition estimation, thickness measurement, 2d mapping