Spectroscopic ellipsometer

UVISEL-2 spectroscopic ellipsometer by HORIBA Jobin Yvon for determining thickness and optical properties of thin films.

Technical specification

  • Spectral range 190 – 2000 nm
  • Angular position from 40 to 90 degrees
  • Stage movement range: 0÷ 200 mm in X axis and 0 ÷ 200 mm in Y axis
  • Modelling software containing a large base of materials allows fitting the model to measurement conditions and material properties

Application

  • Thickness and optical properties measurements for thin films made of transparent or partially transparent materials
  • Thickness and optical properties measurements for multi-layer materials

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